All Issue

2013 Vol.24, Issue 2 Preview Page

April 2013. pp. 92-98
Abstract


References
1 

1.G. Jin, Z. H. Wang, Y. H. Meng, and Z. Y. Zhao, “Imaging ellipsometry for the visualization of bio-molecular layers,” Engineering in Medicine and Biology Society, Proc. The 20th Annual International Conference of the IEEE 20, 581-584 (1998).

2 

2.R. Seitz, R. Brings, and R. Geiger, “Protein adsorption on solid–liquid interfaces monitored by laser-ellipsometry,” Applied Surface Science 252, 154-157 (2005).10.1016/j.apsusc.2005.02.012

3 

3.M. Poksinski and H. Arwin, “Protein monolayers monitored by internal reflection ellipsometry,” The 3rd International Conference on Spectroscopic Ellipsometry 455-456, 716-721 (2004).

4 

4.J. K. Choi, W. Y. Shim, G. Lee, S. Y. Kim, S. U. Park, W. Chegal, Y. J. Cho, and H. M. Cho, “Study on refractive index and thickness of human stem cells by using imaging ellipsometry,” Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 20, 53-56 (2009).10.3807/HKH.2009.20.1.053

5 

5.S.-H. Kim, W. Chegal, J. Doh, H. M. Cho, and D. W. Moon, “Study of cell-matrix adhesion dynamics using surface plasmon resonance imaging ellipsometry,” Biophysical Journal 100, 1819-1828 (2011).10.1016/j.bpj.2011.01.033

6 

6.B. Harbecke, “Coherent and incoherent reflection and transmission of multilayer structures,” Appl. Phys. B 39, 165-170 (1986).10.1007/BF00697414

7 

7.R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, Netherlands, 1987).

8 

8.S. Y. Kim, Ellipsometry (Ajou University Press, Gyeonggi, Korea, 2000), Chapter 3-4.

9 

9.C. C. Katsides and D. I. Siapkas, “General transfer-matrix method for optical multilayer systems with coherent, partially coherent, and incoherent interference,” Appl. Opt. 41, 3978 (2002). 10.1364/AO.41.003978

10 

10.Y. H. Yang and J. R. Abelson, “Spectroscopic ellipsometry of thin films on transparent substrate: a formalism for data interpretation,” J. Vac. Sci. Technol. A13, 1145 (1995).10.1116/1.579601

11 

11.M. Kildemo, R. Ossikovski, and M. Stchakovsky, “Measurement of the absorption edge of thick transparent substrate using the incoherent reflection model and spectroscopic UV-visible- near IR ellipsometry,” Thin Solid Films 313-314, 108-113 (1988).10.1016/S0040-6090(97)00779-7

12 

12.K. Forcht, A. Gombert, R. Joerger, and M. Kohl, “Incoherent superposition in ellipsometric measurement,” Thin Solid Films 302, 43-50 (1997). 10.1016/S0040-6090(96)09555-7

13 

13.H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (John Wiley & Sons, Ibaraki, Japan, 2007), Chapter 5.

14 

14.Y. J. Seo, S. U. Park, S. M. Yang, and S. Y. Kim, “Analysis of the spectro-ellipsometric data with backside reflection from semi-transparent substrate by using a rotating polarizer ellipsometer,” Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 22, 170-178 (2011).10.3807/KJOP.2011.22.4.170

15 

15.http:\\sjbyrnes.com/fresnel_manual.pdf.

16 

16.http:\\www.ellipsotech.com/AT_Semiconductor.html#1.

Information
  • Publisher :Optical Society of Korea
  • Publisher(Ko) :한국광학회
  • Journal Title :Korean Journal of Optics and Photonics
  • Journal Title(Ko) :한국광학회지
  • Volume : 24
  • No :2
  • Pages :92-98
  • Received Date :2013. 01. 11
  • Revised Date :2013. 03. 19
  • Accepted Date : 2013. 03. 21