All Issue

2012 Vol.23, Issue 6 Preview Page

December 2012. pp. 274-280
Abstract


References
1 

1.Y. J. Shin and J. H. Chang, “Vision and status of nuclear hydrogen development in Korea,” KIC News 10, (2007).

2 

2.W. K. Kim, Y. W. Lee, and S. W. Ra, “Simulation of the digital image processing algorithm for the coating thickness automatic measurement of the TRISO-coated fuel particle,” International Journal of Information Processing Systems 1, 36-40 (2005).10.3745/JIPS.2005.1.1.036

3 

3.K. H. Lyum, S. W. Park, and S. Y. Kim, “Optical anisotropy measurement system with a micro spot using PSA ellipsometry at normal incidence,” in Proc. The Optical Society of Korea Winter Annual Meeting (Daejeon Convention Center, Daejeon, Korea, 2012), paper TP-II 24.

4 

4.D. E. Aspnes and A. A. Studna, “Anisotropies in the above-band-gap optical spectra of cubic semiconductors,” Phys. Rev. Lett. 54, 1956-1959 (1985).10.1103/PhysRevLett.54.1956

5 

5.O. Archer, S. M. Koch, F. Omnes, M. Defour, M. Rezeghi, and B. Drevillon, “In situ investigation of the low pressure metalorganic chemical vapor deposition of lattice mismatched semiconductors using reflectance anisotropy measurements,” J. Appl. Phys. 68, 3564-3577 (1990).10.1063/1.346316

6 

6.D. E. Aspnes, Y. C. Chang, A. A. Studna, L. T. Florez, H. H. Farrell, and J. P. Harbison, “Direct optical measurement of surface dielectric responses: interrupted growth on (001) GaAs,” Phys. Rev. Lett. 64, 192-195 (1990).10.1103/PhysRevLett.64.192

7 

7.B. Koopmans, B. Richards, P. Santos, K. Eberl, and M. Cardona, “Inplane optical anisotropy of GaAs/AlAs multiple quantum wells probed by microscopic reflectance difference spectroscopy,” Appl. Phys. Lett. 69, 782-784 (1996).10.1063/1.117890

8 

8.C. H. Li, Y. Sun, S. B. Visbeck, D. C. Law, and R. F. Hicks, “Reflectance difference spectroscopy of an ultrathin indium arsenide layer on indium phosphide (001),” Appl. Phys. Lett. 81, 3939-3941 (2002).10.1063/1.1523650

9 

9.T. D. Kang, G. S. Lee, and H. Lee, “Reflectance difference spectroscopy of CuPt-type ordered Ga0.5In0.5P/GaAs,” J. Korean Phys. Soc. 47, S485-S488 (2005).

10 

10.G. E. Jellison Jr. and J. D. Hunn, “Optical anisotropy measurements of TRISO nuclear fuel particle cross-sections: The method,” Journal of Nuclear Materials 372, 36-44 (2008).10.1016/j.jnucmat.2007.02.008

11 

11.S. Y. Kim, Ellipsometry (Ajou University Press, Gyeonggi, Korea, 2000), pp. 115-120.

12 

12.J. D. Hunn, “Comparison of characterization methods for anisotropy and microstructure of TRISO particle layers,” I-Neri Technical Progress Report (2007).

Information
  • Publisher :Optical Society of Korea
  • Publisher(Ko) :한국광학회
  • Journal Title :Korean Journal of Optics and Photonics
  • Journal Title(Ko) :한국광학회지
  • Volume : 23
  • No :6
  • Pages :274-280
  • Received Date :2012. 10. 09
  • Revised Date :2012. 11. 20
  • Accepted Date : 2012. 11. 20