All Issue

2012 Vol.23, Issue 6 Preview Page

December 2012. pp. 274-280


1.Y. J. Shin and J. H. Chang, “Vision and status of nuclear hydrogen development in Korea,” KIC News 10, (2007).


2.W. K. Kim, Y. W. Lee, and S. W. Ra, “Simulation of the digital image processing algorithm for the coating thickness automatic measurement of the TRISO-coated fuel particle,” International Journal of Information Processing Systems 1, 36-40 (2005).10.3745/JIPS.2005.1.1.036


3.K. H. Lyum, S. W. Park, and S. Y. Kim, “Optical anisotropy measurement system with a micro spot using PSA ellipsometry at normal incidence,” in Proc. The Optical Society of Korea Winter Annual Meeting (Daejeon Convention Center, Daejeon, Korea, 2012), paper TP-II 24.


4.D. E. Aspnes and A. A. Studna, “Anisotropies in the above-band-gap optical spectra of cubic semiconductors,” Phys. Rev. Lett. 54, 1956-1959 (1985).10.1103/PhysRevLett.54.1956


5.O. Archer, S. M. Koch, F. Omnes, M. Defour, M. Rezeghi, and B. Drevillon, “In situ investigation of the low pressure metalorganic chemical vapor deposition of lattice mismatched semiconductors using reflectance anisotropy measurements,” J. Appl. Phys. 68, 3564-3577 (1990).10.1063/1.346316


6.D. E. Aspnes, Y. C. Chang, A. A. Studna, L. T. Florez, H. H. Farrell, and J. P. Harbison, “Direct optical measurement of surface dielectric responses: interrupted growth on (001) GaAs,” Phys. Rev. Lett. 64, 192-195 (1990).10.1103/PhysRevLett.64.192


7.B. Koopmans, B. Richards, P. Santos, K. Eberl, and M. Cardona, “Inplane optical anisotropy of GaAs/AlAs multiple quantum wells probed by microscopic reflectance difference spectroscopy,” Appl. Phys. Lett. 69, 782-784 (1996).10.1063/1.117890


8.C. H. Li, Y. Sun, S. B. Visbeck, D. C. Law, and R. F. Hicks, “Reflectance difference spectroscopy of an ultrathin indium arsenide layer on indium phosphide (001),” Appl. Phys. Lett. 81, 3939-3941 (2002).10.1063/1.1523650


9.T. D. Kang, G. S. Lee, and H. Lee, “Reflectance difference spectroscopy of CuPt-type ordered Ga0.5In0.5P/GaAs,” J. Korean Phys. Soc. 47, S485-S488 (2005).


10.G. E. Jellison Jr. and J. D. Hunn, “Optical anisotropy measurements of TRISO nuclear fuel particle cross-sections: The method,” Journal of Nuclear Materials 372, 36-44 (2008).10.1016/j.jnucmat.2007.02.008


11.S. Y. Kim, Ellipsometry (Ajou University Press, Gyeonggi, Korea, 2000), pp. 115-120.


12.J. D. Hunn, “Comparison of characterization methods for anisotropy and microstructure of TRISO particle layers,” I-Neri Technical Progress Report (2007).

  • Publisher :Optical Society of Korea
  • Publisher(Ko) :한국광학회
  • Journal Title :Korean Journal of Optics and Photonics
  • Journal Title(Ko) :한국광학회지
  • Volume : 23
  • No :6
  • Pages :274-280
  • Received Date :2012. 10. 09
  • Revised Date :2012. 11. 20
  • Accepted Date : 2012. 11. 20