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2015 Vol.26, Issue 5 Preview Page

October 2015. pp. 275-282
Abstract


References
1 

1.K. H. Lyum, S. U. Park, S. M. Yang, H. K. Yoon, and S. Y. Kim, “Precise measurement of ultra small retardation of rubbed polyimide alignment layer using an improved transmission ellipsometer,” Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 24, 77-85 (2013).10.3807/KJOP.2013.24.2.077

2 

2.K. H. Lyum, H. K. Yoon, S. J. Kim, S. H. An, and S. Y. Kim, “Study of ultra-small optical anisotropy profile of rubbed polyimide film by using transmission ellipsometry,”  J. Opt. Soc. Korea 18, 156-161 (2014).10.3807/JOSK.2014.18.2.156

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3.J. H. Lee, M. S. Park, S. M. Yang, S. U. Park, M. H. Lee, and S. Y. Kim, “Precise measurement of ultra small anisotropy of rubbed polyimide using an improved reflection ellipsometer,” Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 26, 195-202 (2015).10.3807/KJOP.2015.26.4.195

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4.D. W. Berreman, “Optics in stratified and anisotropic media: 4x4-matrix formalism,” J. Opt. Soc. Am. 62, 502-510 (1972).10.1364/JOSA.62.000502

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5.I. Hirosawa, “Method of characterizing rubbed polyimide film for liquid crystal display devices using reflection ellipsometry,” Jpn. J. Appl. Phys. 35, 5873-5875 (1996).10.1143/JJAP.35.5873

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6.P. Yeh and C. Gu, Optics of Liquid Crystal Displays (John Wiley & Sons, Inc., New York, USA, 1999), Chapter 3 and Chapter 8.

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8.S. Y. Kim, “Ellipsometric expressions of multilayered substrate coated with a uniaxially anisotropic alignment layer,” Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 24, 271-278 (2013).10.3807/KJOP.2013.24.5.271

9 

9.S. Y. Kim, “Ellipsometric expressions for two uniaxially anisotropic layers coated on a multilayered substrate,” Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 26, 115-120 (2015).10.3807/KJOP.2015.26.2.115

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10.J. W. Ryu, Ph. D. Thesis, Ajou University, Suwon (2010).

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11.R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, Netherlands, 1987), Chapter 4.

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12.E. Hecht, Optics (Addison-Wesley Publishing Co., Massachusetts, USA, 1987), Chapter 8.

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13.O. S. Heaven, Optical Properties of Thin Films (Dover Publication, Inc., 1955).

14 

14.S. Y. Kim, Ellipsometry (Ajou University Press, Gyeonggi, Korea, 2000), Chapter 3-4.

Information
  • Publisher :Optical Society of Korea
  • Publisher(Ko) :한국광학회
  • Journal Title :Korean Journal of Optics and Photonics
  • Journal Title(Ko) :한국광학회지
  • Volume : 26
  • No :5
  • Pages :275-282
  • Received Date :2015. 07. 23
  • Revised Date :2015. 09. 02
  • Accepted Date : 2015. 09. 14