All Issue

2015 Vol.26, Issue 4 Preview Page

August 2015. pp. 195-202


1.H. J. Ahn and S. H. Paek, “Analysis of properties of rubbed polyimide alignment layer and rubbing effect of various rubbing cloths for LCD fabrication,” Polymer Korea 35, 385-389 (2011).


2.W. C. Kim, “Study on the LC alignment on vertical alignment polymer surface using the AFM,” Journal of KIEEME 16, 510-514 (2003).


3.J. H. Kim and H. Yokoyama, “Nano-rubbing of a liquid crystal alignment layer by an atomic force microscope : a detailed characterization,” Nanotechnology 13, 133-137 (2002).10.1088/0957-4484/13/2/301


4.C. Yu, J. Bae, C. M. Keum, and S. D. Lee, “Optical anisotropy of aligned pentacene molecules on a rubbed polymer corresponding to the electrical anisotropy,” Current Applied Physics 10, 64-67 (2010).10.1016/j.cap.2009.04.013


5.J. A. Ekhoff, M. J. Farrow, D. M. Walba, and K. L. Rowlen, “Molecular orientation of a model liquid crystal alignment layer,” Talanta 60, 801-808 (2003).10.1016/S0039-9140(03)00141-3


6.G. Fang, J. Maclennan, and N. Clark, “High extinction polarimeter for the precision measurement of the in-plane optical anisotropy of molecular monolayers,” Langmuir 26, 11686-11689 (2010).10.1021/la101117n


7.H. Murai, K. Ekawa, J. Takashima, H. Naito, and N. Nakatsuka, “Mura-detection method by using a slit-beam ellipsometer,” J. SID 15, 281-286 (2007).10.1889/1.2739796


8.Y. L. Lo, J. F. Lin, and S. Y. Lee, “Polariscope for simultaneous measurement of the principal axis and the phase retardation by use of two phase-locked extractions,” Appl. Opt. 43, 6248-6254 (2004).10.1364/AO.43.006248


9.M. Hideyuki, E. Koichi, T. Jun, N. Hitoshi, and N. Nobuo, “Useful inspection method of rubbed polyimide film with optical anisotropy using reflection ellipsometry,” SID Symposium Digest 37, 490-493 (2006).


10.S. Y. Kim, Ellipsometry (Ajou University Press, Gyeonggi, Korea, 2000), Chapter 3-4.


11.Y. S. Shin, M. S. Thesis, Ajou University, Suwon (2009).


12.K. H. Lyum, S. U. Park, S. M. Yang, H. K. Yoon, and S. Y. Kim, “Precise measurement of ultra small retardation of LCD alignment layer using improved transmission ellipsometry,” J. Korean Phys. Soc. 24, 77-85 (2013).


13.R. A. Synowicki, “Suppression of backside reflections from transparent substrates,” Phys. Stat. Sol. 5, 1085-1088 (2008).10.1002/pssc.200777873


14.Y. J. Seo and S. Y. Kim, “Analysis of the spectro-ellipsometric data with backside reflection from semi-transparent substrate by using a rotating polarizer ellipsometer,” Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 22, 170-178 (2011).10.3807/KJOP.2011.22.4.170


15.H. K. Yoon, M. S. Thesis, Ajou University, Suwon (2014).


16.H. J. Ahn, J. J. Lee, J. S. Ahn, and K. C. Park, “Analysis of properties of rubbed polyimide alignment layer and rubbing effect of various rubbing cloths LCD fabrication,” Polymer 35, 385-389 (2011).


17.S. Y. Kim, “Ellipsometric expressions of multilayered substrate coated with a uniaxially anisotropic alignment layer,” Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 24, 271-278 (2013).10.3807/KJOP.2013.24.5.271


18.S. Y. Kim, “Ellipsometric expressions for two uniaxially anisotropic layers coated on a multilayered substrate,” Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 26, 115-120 (2015).10.3807/KJOP.2015.26.2.115

  • Publisher :Optical Society of Korea
  • Publisher(Ko) :한국광학회
  • Journal Title :Korean Journal of Optics and Photonics
  • Journal Title(Ko) :한국광학회지
  • Volume : 26
  • No :4
  • Pages :195-202
  • Received Date :2015. 06. 12
  • Revised Date :2015. 06. 30
  • Accepted Date : 2015. 07. 01